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Products: LUNA 6415 Optical Device Analyzer

The Luna 6415 optical device analyzer uses optical frequency domain reflection (OFDR) technology to obtain backward Rayleigh scattered light or transmitted light as a function of distance by detecting it.The Luna 6415 is the ideal analyzer for photonic integrated circuits and silicon optical chips, thanks to its ultra-high sensitivity and spatial resolution (20 μm).The Luna 6415 single instrument can perform all tests of IL, RL, length, etc. by selecting reflection or The Luna 6415 can perform all tests such as IL, RL, and length by selecting reflection or transmission modes, which greatly reduces test costs and simplifies the test process. Compared with other test systems, it will greatly increase the test yield.

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Features Applications

Return loss (RL) and insertion loss (IL) analysis

Reflection and transmission mode analysis devices

Return loss distribution in the optical path length direction

Spectral analysis of RL and IL

Detection and precise localization of reflection events and measurement of optical path lengths (up to 100 m)

Optimized speed, spatial resolution and accuracy for production testing: 20 μm sampling resolution

RL spatial distribution testing

Automatic IL testing and analysis

Delay measurement resolution up to sub-picosecond

Testing of PLCs, optical waveguide devices, AWGs, ROADMs, etc.

Testing of couplers, optical switches, beam splitters, etc.